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- 2003284227 contributor B9597513.
- 2003284227 contributor B9597514.
- 2003284227 created "c2003.".
- 2003284227 date "2003".
- 2003284227 date "c2003.".
- 2003284227 dateCopyrighted "c2003.".
- 2003284227 description "Includes bibliographical references and author index.".
- 2003284227 extent "xxi, 516 p. :".
- 2003284227 identifier "0819449733".
- 2003284227 isPartOf "Proceedings / SPIE--the International Society for Optical Engineering ; v. 5113".
- 2003284227 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 5113.".
- 2003284227 issued "2003".
- 2003284227 issued "c2003.".
- 2003284227 language "eng".
- 2003284227 publisher "Bellingham, Wash. : SPIE,".
- 2003284227 subject "621.382/24 22".
- 2003284227 subject "Electric circuits Noise Congresses.".
- 2003284227 subject "Electric noise Congresses.".
- 2003284227 subject "Electronic circuits Noise Congresses.".
- 2003284227 subject "Electronic noise Congresses.".
- 2003284227 subject "TK7867.5 .N614 2003".
- 2003284227 title "Noise in devices and circuits : 2-4 June, 2003, Santa Fe, New Mexico, USA / M. Jamal Deen, Zeynep Çelik-Butler, Michael E. Levinshtein, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, National Semiconductor Corporation ; published by SPIE--the International Society for Optical Engineering.".
- 2003284227 type "text".