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- 2003535275 contributor B9769759.
- 2003535275 contributor B9769760.
- 2003535275 created "c2002.".
- 2003535275 date "2002".
- 2003535275 date "c2002.".
- 2003535275 dateCopyrighted "c2002.".
- 2003535275 description "Includes bibliographic references and author index.".
- 2003535275 extent "viii, 192 p. :".
- 2003535275 identifier "0819445460".
- 2003535275 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 4779.".
- 2003535275 isPartOf "SPIE proceedings series, 0277-786X ; v. 4779".
- 2003535275 issued "2002".
- 2003535275 issued "c2002.".
- 2003535275 language "eng".
- 2003535275 publisher "Bellingham, Washington : SPIE,".
- 2003535275 subject "621.36 21".
- 2003535275 subject "Information storage and retrieval systems Congresses.".
- 2003535275 subject "Metrology Congresses.".
- 2003535275 subject "Optical materials Congresses.".
- 2003535275 subject "QC373 .A38 2002".
- 2003535275 subject "Semiconductors Characterization Congresses.".
- 2003535275 title "Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA / Angela Duparré, Bhanwar Singh, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company (USA) ... [et al.].".
- 2003535275 type "text".