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- 2003535276 contributor B9769761.
- 2003535276 contributor B9769762.
- 2003535276 created "c2002.".
- 2003535276 date "2002".
- 2003535276 date "c2002.".
- 2003535276 dateCopyrighted "c2002.".
- 2003535276 description "Includes bibliographic references and author index.".
- 2003535276 extent "vii, 186 p. :".
- 2003535276 identifier "0819445479".
- 2003535276 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 4780.".
- 2003535276 isPartOf "SPIE proceedings series ; v. 4780".
- 2003535276 issued "2002".
- 2003535276 issued "c2002.".
- 2003535276 language "eng".
- 2003535276 publisher "Bellingham, Washington : SPIE,".
- 2003535276 subject "620/.44 21".
- 2003535276 subject "Diffractive scattering Congresses.".
- 2003535276 subject "Metrology Congresses.".
- 2003535276 subject "Optical measurements Congresses.".
- 2003535276 subject "Scattering (Physics) Congresses.".
- 2003535276 subject "Surface roughness Measurement Congresses.".
- 2003535276 subject "TA418.7 .S929 2002".
- 2003535276 title "Surface scattering and diffraction for advanced metrology II : 9 July, 2002, Seattle, Washington, USA / Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company ... [et al.].".
- 2003535276 type "text".