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- 2003542835 alternative "Zairyō hyōka no tameno bunseki denshi kenbikyōhō. English".
- 2003542835 contributor B9776336.
- 2003542835 contributor B9776337.
- 2003542835 created "c2002.".
- 2003542835 date "2002".
- 2003542835 date "c2002.".
- 2003542835 dateCopyrighted "c2002.".
- 2003542835 description "Includes bibliographical references and index.".
- 2003542835 extent "ix, 152 p. :".
- 2003542835 identifier "4431703365 (pbk.)".
- 2003542835 issued "2002".
- 2003542835 issued "c2002.".
- 2003542835 language "eng jpn".
- 2003542835 language "eng".
- 2003542835 publisher "Tokyo ; Berlin : Springer,".
- 2003542835 subject "620.11299 21".
- 2003542835 subject "Electron microscopy.".
- 2003542835 subject "Materials Microscopy.".
- 2003542835 subject "TA417.23 .S5313 2002".
- 2003542835 title "Analytical electron microscopy for materials science / D. Shindo, T. Oikawa.".
- 2003542835 title "Zairyō hyōka no tameno bunseki denshi kenbikyōhō. English".
- 2003542835 type "text".