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- 2003545294 alternative "ATS'02".
- 2003545294 contributor B9778852.
- 2003545294 contributor B9778853.
- 2003545294 created "c2002.".
- 2003545294 date "2002".
- 2003545294 date "c2002.".
- 2003545294 dateCopyrighted "c2002.".
- 2003545294 description "Includes bibliographic references and author index.".
- 2003545294 extent "xxi, 437 p. :".
- 2003545294 hasFormat "Also available via the World Wide Web.".
- 2003545294 identifier "0769518257".
- 2003545294 isFormatOf "Also available via the World Wide Web.".
- 2003545294 issued "2002".
- 2003545294 issued "c2002.".
- 2003545294 language "eng".
- 2003545294 publisher "Los Alamitos, California : IEEE Computer Society,".
- 2003545294 relation "Also available via the World Wide Web.".
- 2003545294 subject "621.3815/48 22".
- 2003545294 subject "Electronic circuits Testing Congresses.".
- 2003545294 subject "Electronic digital computers Circuits Testing Congresses.".
- 2003545294 subject "Fault-tolerant computing Congresses.".
- 2003545294 subject "TK7888.4 .A83 2002".
- 2003545294 title "11th Asian Test Symposium (ATS'02) : proceedings of the 11th Asian Test Symposium : 18-20 November, 2002, Guam, USA / sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC) ; in cooperation with Technical Group on Dependable Computing, IEICE, Special Interest Group on System LSI Design Methodology, IPS Japan.".
- 2003545294 title "ATS'02".
- 2003545294 type "text".