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- 2004041373 contributor B9844020.
- 2004041373 created "2004.".
- 2004041373 date "2004".
- 2004041373 date "2004.".
- 2004041373 dateCopyrighted "2004.".
- 2004041373 description "Includes bibliographical references and index.".
- 2004041373 extent "xx, 221 p. :".
- 2004041373 identifier "1402077521 (alk. paper)".
- 2004041373 identifier 2004041373-d.html.
- 2004041373 identifier 2004041373.html.
- 2004041373 isPartOf "Frontiers in electronic testing".
- 2004041373 issued "2004".
- 2004041373 issued "2004.".
- 2004041373 language "eng".
- 2004041373 publisher "Boston : Kluwer Academic,".
- 2004041373 subject "004.5/3 22".
- 2004041373 subject "Random access memory Testing.".
- 2004041373 subject "TK7895.M4 H343 2004".
- 2004041373 title "Testing static random access memories : defects, fault models, and test patterns / by Said Hamdioui.".
- 2004041373 type "text".