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- 2004045180 contributor B9848373.
- 2004045180 contributor B9848374.
- 2004045180 created "2004.".
- 2004045180 date "2004".
- 2004045180 date "2004.".
- 2004045180 dateCopyrighted "2004.".
- 2004045180 description "Includes bibliographical references (p. 335-349) and index.".
- 2004045180 extent "xi, 353 p. :".
- 2004045180 identifier "0521453739".
- 2004045180 identifier 2004045180.html.
- 2004045180 identifier 2004045180-b.html.
- 2004045180 identifier 2004045180.html.
- 2004045180 issued "2004".
- 2004045180 issued "2004.".
- 2004045180 language "eng".
- 2004045180 publisher "Cambridge, U.K. ; New York : Cambridge University Press,".
- 2004045180 subject "530.4/275 22".
- 2004045180 subject "QC176.84.S93 I24 2004".
- 2004045180 subject "Reflection high energy electron diffraction.".
- 2004045180 subject "Thin films Surfaces Analysis.".
- 2004045180 title "Reflection high-energy electron diffraction / Ayahiko Ichimiya and Philip I. Cohen.".
- 2004045180 type "text".