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- 2004047755 contributor B9851365.
- 2004047755 contributor B9851366.
- 2004047755 created "c2004.".
- 2004047755 date "2004".
- 2004047755 date "c2004.".
- 2004047755 dateCopyrighted "c2004.".
- 2004047755 description "Includes bibliographical references (p. 275-289) and index.".
- 2004047755 extent "xiii, 293 p. :".
- 2004047755 identifier "030648496X".
- 2004047755 identifier 2004047755-d.html.
- 2004047755 identifier 2004047755.html.
- 2004047755 issued "2004".
- 2004047755 issued "c2004.".
- 2004047755 language "eng".
- 2004047755 publisher "New York : Kluwer Academic/Plenum Publishers,".
- 2004047755 subject "004 22".
- 2004047755 subject "Electronic digital computers Reliability.".
- 2004047755 subject "QA76.5 .X54 2004".
- 2004047755 title "Computing system reliability : models and analysis / Min Xie, Yuan-Shun Dai, and Kim-Leng Poh.".
- 2004047755 type "text".