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- 2004100366 alternative "High dielectric constant materials: materials science, processing, reliability, and manufacturing issues".
- 2004100366 contributor B9873229.
- 2004100366 contributor B9873230.
- 2004100366 contributor B9873231.
- 2004100366 created "c2004.".
- 2004100366 date "2004".
- 2004100366 date "c2004.".
- 2004100366 dateCopyrighted "c2004.".
- 2004100366 description "Includes bibliographical references and indexes.".
- 2004100366 extent "xvii, 490 p. :".
- 2004100366 identifier "1566774055".
- 2004100366 isPartOf "Proceedings (Electrochemical Society) ; v. 2003-22.".
- 2004100366 isPartOf "Proceedings ; v. 2003-22".
- 2004100366 issued "2004".
- 2004100366 issued "c2004.".
- 2004100366 language "eng".
- 2004100366 publisher "Pennington, N.J. : Electrochemical Society,".
- 2004100366 subject "537/.24 22".
- 2004100366 subject "Dielectrics Congresses.".
- 2004100366 subject "Gate array circuits Congresses.".
- 2004100366 subject "TK7895.G36 P49 2003".
- 2004100366 title "High dielectric constant materials: materials science, processing, reliability, and manufacturing issues".
- 2004100366 title "Physics and technology of high-k gate dielectrics II : proceedings of the Second International Symposium on High Dielectric Constant Materials: Materials Science, Processing, Reliability, and Manufacturing Issues : held in Orlando, Florida, October 12-16, 2003 / editors, S. Kar ... [et al.] ; sponsoring divisions: Dielectric Science and Technology, Electronics.".
- 2004100366 type "text".