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- 2004101280 alternative "63rd ARFTG conference digest".
- 2004101280 contributor B9873916.
- 2004101280 contributor B9873917.
- 2004101280 created "2004.".
- 2004101280 created "c2004.".
- 2004101280 date "2004".
- 2004101280 date "c2004.".
- 2004101280 dateCopyrighted "c2004.".
- 2004101280 description "Electronic reproduction. New York, N.Y. : IEEE, 2004. System requirements: Adobe Acrobat Reader. Mode of access: World Wide Web. Made available through IEEE Xplore.".
- 2004101280 description "Includes bibliographical references.".
- 2004101280 extent "x, 227 p. :".
- 2004101280 identifier "0780383710".
- 2004101280 identifier opac?punumber=9529.
- 2004101280 issued "2004".
- 2004101280 issued "c2004.".
- 2004101280 language "eng".
- 2004101280 publisher "Piscataway, NJ : IEEE,".
- 2004101280 subject "621.381/3 22".
- 2004101280 subject "Microwaves Congresses.".
- 2004101280 subject "Radio frequency Congresses.".
- 2004101280 subject "TK7876 .A754 2004".
- 2004101280 temporal "New York, N.Y. :".
- 2004101280 title "63rd ARFTG conference digest".
- 2004101280 title "On wafer characterization [electronic resource] : 63rd ARFTG Conference digest : Spring, 2004 : 11 June, 2004, Fort Worth, TX / Automatic RF Techniques Group.".
- 2004101280 type "text".