Matches in Library of Congress for { <http://lccn.loc.gov/2004103511> ?p ?o. }
Showing items 1 to 28 of
28
with 100 items per page.
- 2004103511 alternative "11th International Symposium on the Physical & Failure Analysis of Integrated Circuits 2004".
- 2004103511 alternative "IPFA 2004 proceedings".
- 2004103511 alternative "Physical & failure analysis of integrated circuits".
- 2004103511 contributor B9875702.
- 2004103511 contributor B9875703.
- 2004103511 contributor B9875704.
- 2004103511 created "c2004.".
- 2004103511 date "2004".
- 2004103511 date "c2004.".
- 2004103511 dateCopyrighted "c2004.".
- 2004103511 description "Includes bibliographical references and author index.".
- 2004103511 extent "326 p. :".
- 2004103511 identifier "0780384547".
- 2004103511 identifier opac?punumber=9322.
- 2004103511 issued "2004".
- 2004103511 issued "c2004.".
- 2004103511 language "eng".
- 2004103511 publisher "Piscataway, N.J. : IEEE,".
- 2004103511 subject "621.3815 22".
- 2004103511 subject "Integrated circuits Defects Congresses.".
- 2004103511 subject "Integrated circuits Reliability Congresses.".
- 2004103511 subject "Integrated circuits Testing Congresses.".
- 2004103511 subject "TK7874 .I47377 2004".
- 2004103511 title "11th International Symposium on the Physical & Failure Analysis of Integrated Circuits 2004".
- 2004103511 title "IPFA 2004 proceedings".
- 2004103511 title "Physical & failure analysis of integrated circuits".
- 2004103511 title "Proceedings of the 11th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2004 : [July 5-8, 2004, Taiwan] / edited by Steve S. Chung ... [et al.] ; organised by IEEE ED Taipei Chapter ... [et al.] ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with IEEE Reliability/CPMT/ED Singapore Chapter.".
- 2004103511 type "text".