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- 2004116223 contributor B9885862.
- 2004116223 contributor B9885863.
- 2004116223 created "2005.".
- 2004116223 date "2005".
- 2004116223 date "2005.".
- 2004116223 dateCopyrighted "2005.".
- 2004116223 description "Includes bibliographical references and index.".
- 2004116223 extent "xi, 231 p. :".
- 2004116223 identifier "354022680X (hd.bd.)".
- 2004116223 identifier 2004116223-d.html.
- 2004116223 identifier 2004116223-b.html.
- 2004116223 identifier 2004116223-t.html.
- 2004116223 isPartOf "Microtechnology and MEMS, 1439-6599".
- 2004116223 issued "2005".
- 2004116223 issued "2005.".
- 2004116223 language "eng".
- 2004116223 publisher "Berlin ; New York : Springer,".
- 2004116223 subject "621.36/4 22".
- 2004116223 subject "Charge coupled devices.".
- 2004116223 subject "Image processing Digital techniques.".
- 2004116223 subject "Remote sensing.".
- 2004116223 subject "Service life (Engineering)".
- 2004116223 subject "TA1637 .L42 2005".
- 2004116223 title "CCD image sensors in deep-ultraviolet : degradation behavior and damage mechanisms / F.M. Li, A. Nathan.".
- 2004116223 type "text".