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- 2004268428 contributor B9890482.
- 2004268428 contributor B9890483.
- 2004268428 created "c2003.".
- 2004268428 date "2003".
- 2004268428 date "c2003.".
- 2004268428 dateCopyrighted "c2003.".
- 2004268428 description "Includes bibliographic references and author index.".
- 2004268428 extent "xix, 430 p. :".
- 2004268428 identifier "081944975X".
- 2004268428 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering. v. 5115.".
- 2004268428 isPartOf "SPIE proceedings series ; v. 5115".
- 2004268428 issued "2003".
- 2004268428 issued "c2003.".
- 2004268428 language "eng".
- 2004268428 publisher "Bellingham, Washington : SPIE,".
- 2004268428 subject "621.382/24 22".
- 2004268428 subject "Detectors. Congresses.".
- 2004268428 subject "Electronic noise Congresses.".
- 2004268428 subject "Electronic noise Standards Congresses.".
- 2004268428 subject "Information technology. Congresses.".
- 2004268428 subject "Nanotechnology Congresses.".
- 2004268428 subject "Quantum electronics Congresses.".
- 2004268428 subject "TK7867.5 N58 2003".
- 2004268428 title "Noise and information in nanoelectronics, sensors, and standards : 2-4 June 2003, Santa Fe, New Mexico, USA / Laszlo B. Kish ... [et al.], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] TAMU Telecommunications Task Force (USA) ; published by SPIE--the International Society for Optical Engineering.".
- 2004268428 type "text".