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- 2004270983 contributor B9893639.
- 2004270983 contributor B9893640.
- 2004270983 created "c2003.".
- 2004270983 date "2003".
- 2004270983 date "c2003.".
- 2004270983 dateCopyrighted "c2003.".
- 2004270983 description "Includes bibliographical references and author index.".
- 2004270983 extent "vii, 324 p. :".
- 2004270983 identifier "0819448117".
- 2004270983 identifier 2004270983.html.
- 2004270983 isPartOf "Electronic Imaging Science and Technology Symposium. Proceedings of Electronic Imaging Science and Technology.".
- 2004270983 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 5011.".
- 2004270983 isPartOf "Proceedings, Electronic Imaging Science and Technology".
- 2004270983 isPartOf "SPIE proceedings series ; v. 5011".
- 2004270983 issued "2003".
- 2004270983 issued "c2003.".
- 2004270983 language "eng".
- 2004270983 publisher "Bellingham, Wash. : SPIE,".
- 2004270983 subject "Computer vision Industrial applications Congresses.".
- 2004270983 subject "Engineering inspection Automation Congresses.".
- 2004270983 subject "Measurement Congresses.".
- 2004270983 subject "Quality control Optical methods Automation Congresses.".
- 2004270983 subject "TS156.2 .M3258 2003".
- 2004270983 title "Machine vision applications in industrial inspection XI : 22-24 January, 2003, Santa Clara, California, USA / Martin A. Hunt, Jeffery R. Price, chairs/editors ; sponsored and published by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering.".
- 2004270983 type "text".