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- 2004271996 contributor B9894980.
- 2004271996 created "c2002.".
- 2004271996 date "2002".
- 2004271996 date "c2002.".
- 2004271996 dateCopyrighted "c2002.".
- 2004271996 description "Includes bibliographical references and index.".
- 2004271996 extent "viii, 180 p. :".
- 2004271996 identifier "0819443875".
- 2004271996 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 4648.".
- 2004271996 isPartOf "SPIE proceedings series, 0277-786X ; v. 4648".
- 2004271996 issued "2002".
- 2004271996 issued "c2002.".
- 2004271996 language "eng".
- 2004271996 publisher "Bellingham, Wash. : SPIE,".
- 2004271996 subject "621.381/045 22".
- 2004271996 subject "Optoelectronic devices Reliability Congresses.".
- 2004271996 subject "Optoelectronic devices Testing Congresses.".
- 2004271996 subject "TK8300 .T466 2002".
- 2004271996 title "Test and measurement applications of optoelectronic devices : 21-22 January, 2002, San Jose, USA / Aland K. Chin ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.".
- 2004271996 type "text".