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- 2004272254 alternative "MTDT 2003".
- 2004272254 contributor B9895351.
- 2004272254 contributor B9895352.
- 2004272254 contributor B9895353.
- 2004272254 created "c2003.".
- 2004272254 date "2003".
- 2004272254 date "c2003.".
- 2004272254 dateCopyrighted "c2003.".
- 2004272254 description "Includes bibliographical references and author index.".
- 2004272254 extent "ix, 95 p. :".
- 2004272254 hasFormat "Also available via the World Wide Web.".
- 2004272254 identifier "0769520049".
- 2004272254 isFormatOf "Also available via the World Wide Web.".
- 2004272254 issued "2003".
- 2004272254 issued "c2003.".
- 2004272254 language "eng".
- 2004272254 publisher "Los Alamitos, Calif. : IEEE Computer Society,".
- 2004272254 relation "Also available via the World Wide Web.".
- 2004272254 subject "621.39/732 22".
- 2004272254 subject "Random access memory Congresses.".
- 2004272254 subject "Semiconductor storage devices Testing Congresses.".
- 2004272254 subject "TK7895.M4 I334 2003".
- 2004272254 title "MTDT 2003".
- 2004272254 title "Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing, 28-29 July, 2003, San Jose, California / [edited by Tom Wik, Adit Singh, and Rochit Rajsuman] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with IEEE Solid-State Circuits Society.".
- 2004272254 type "text".