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- 2004273845 contributor B9897438.
- 2004273845 contributor B9897439.
- 2004273845 contributor B9897440.
- 2004273845 contributor B9897437.
- 2004273845 created "c2003.".
- 2004273845 date "2003".
- 2004273845 date "c2003.".
- 2004273845 dateCopyrighted "c2003.".
- 2004273845 description "Includes bibliographic references and indexes.".
- 2004273845 extent "xv, 515 p. :".
- 2004273845 identifier "1558997032".
- 2004273845 isPartOf "Materials Research Society symposia proceedings ; v. 766.".
- 2004273845 isPartOf "Materials Research Society symposium proceedings ; v. 766".
- 2004273845 issued "2003".
- 2004273845 issued "c2003.".
- 2004273845 language "eng".
- 2004273845 publisher "Warrendale, Pa. : Materials Research Society,".
- 2004273845 subject "621.3815/2 22".
- 2004273845 subject "Dielectric films Congresses.".
- 2004273845 subject "Integrated circuits Materials Congresses.".
- 2004273845 subject "Integrated circuits Reliability Congresses.".
- 2004273845 subject "Semiconductors Junctions Congresses.".
- 2004273845 subject "Semiconductors Materials Congresses.".
- 2004273845 subject "TK7871.85 .S95343 2003".
- 2004273845 title "Materials, technology and reliability for advanced interconnects and low-k dielectrics, 2003 : symposium held April 21-25, 2003, San Francisco, California, U.S.A / editors: Andrew J. McKerrow ... [et al.].".
- 2004273845 type "text".