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- 2004298723 contributor B9907421.
- 2004298723 contributor B9907422.
- 2004298723 created "c2003.".
- 2004298723 date "2003".
- 2004298723 date "c2003.".
- 2004298723 dateCopyrighted "c2003.".
- 2004298723 description "Includes bibliographical references and index.".
- 2004298723 extent "x, 402 p. :".
- 2004298723 identifier "0819450618".
- 2004298723 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 5188.".
- 2004298723 isPartOf "SPIE proceedings series, 0277-786X ; v. 5188".
- 2004298723 issued "2003".
- 2004298723 issued "c2003.".
- 2004298723 language "eng".
- 2004298723 publisher "Bellingham, Wash., USA : SPIE,".
- 2004298723 subject "621.381/045 22".
- 2004298723 subject "Nanotechnology Congresses.".
- 2004298723 subject "Optical measurements Congresses.".
- 2004298723 subject "Optoelectronic devices Congresses.".
- 2004298723 subject "Optoelectronics Congresses.".
- 2004298723 subject "Semiconductors Characterization Congresses.".
- 2004298723 subject "TA1750 .A33 2003".
- 2004298723 subject "Thin films Optical properties Congresses.".
- 2004298723 title "Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA / Angela Duparré, Bhanwar Singh, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.".
- 2004298723 type "text".