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- 2004303010 contributor B9912633.
- 2004303010 contributor B9912634.
- 2004303010 created "c2004.".
- 2004303010 date "2004".
- 2004303010 date "c2004.".
- 2004303010 dateCopyrighted "c2004.".
- 2004303010 description "Includes bibliographical references and author index.".
- 2004303010 extent "v, 214 p. :".
- 2004303010 identifier "0819451533".
- 2004303010 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 5265.".
- 2004303010 isPartOf "SPIE proceedings series ; v. 5265".
- 2004303010 issued "2004".
- 2004303010 issued "c2004.".
- 2004303010 language "eng".
- 2004303010 publisher "Bellingham, Wash. USA : SPIE,".
- 2004303010 subject "Computer vision Congresses.".
- 2004303010 subject "Imaging systems Congresses.".
- 2004303010 subject "Metrology Congresses.".
- 2004303010 subject "Optical measurements Congresses.".
- 2004303010 subject "Optical pattern recognition systems Congresses.".
- 2004303010 subject "Quality control Optical methods Congresses.".
- 2004303010 subject "TA1634 .T942 2004".
- 2004303010 subject "Three-dimensional display systems Congresses.".
- 2004303010 title "Two- and three-dimensional vision systems for inspection, control, and metrology : 29-30 October 2003, Providence, Rhode Island, USA / Bruce G. Batchelor, Heinz Hügli, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.".
- 2004303010 type "text".