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- 2004304501 contributor B9914480.
- 2004304501 contributor B9914481.
- 2004304501 created "c2004.".
- 2004304501 date "2004".
- 2004304501 date "c2004.".
- 2004304501 dateCopyrighted "c2004.".
- 2004304501 description "Includes bibliographical references and author index.".
- 2004304501 extent "viii, 272 p. :".
- 2004304501 identifier "0819453099".
- 2004304501 identifier 2004304501.html.
- 2004304501 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 5392.".
- 2004304501 isPartOf "SPIE proceedings series ; v. 5392".
- 2004304501 issued "2004".
- 2004304501 issued "c2004.".
- 2004304501 language "eng".
- 2004304501 publisher "Bellingham, Wash. : SPIE,".
- 2004304501 subject "621.36 22".
- 2004304501 subject "Electrooptical devices Materials Testing Congresses.".
- 2004304501 subject "Microelectromechanical systems Testing Congresses.".
- 2004304501 subject "Nanostructured materials Testing Congresses.".
- 2004304501 subject "Photonics Materials Testing Congresses.".
- 2004304501 subject "TA1750 .T472 2004".
- 2004304501 title "Testing, reliability, and application of micro- and nano-material systems II : 15-17 March, 2004, San Diego, California, USA / Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.".
- 2004304501 type "text".