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- 2004327075 contributor B9924710.
- 2004327075 contributor B9924711.
- 2004327075 created "2003.".
- 2004327075 created "2004.".
- 2004327075 date "2003".
- 2004327075 date "2003.".
- 2004327075 dateCopyrighted "2003.".
- 2004327075 description "Microfiche. New Delhi : Library of Congress Office ; Washington, D.C. : Library of Congress Photoduplication Service, 2004. 1 microfiche. Master microform held by: DLC.".
- 2004327075 extent "1 microfiche.".
- 2004327075 extent "ii, 14 p. :".
- 2004327075 isPartOf "BARC external ; BARC/2003/E/014".
- 2004327075 issued "2003".
- 2004327075 issued "2003.".
- 2004327075 language "Abstract in English and Hindi.".
- 2004327075 language "eng hin".
- 2004327075 language "eng".
- 2004327075 publisher "Mumbai : Bhabha Atomic Research Centre,".
- 2004327075 subject "Irradiation Measurement.".
- 2004327075 subject "Microfiche 2004/60098 (Q)".
- 2004327075 subject "Oxides Measurement.".
- 2004327075 temporal "New Delhi :Washington, D.C. :".
- 2004327075 title "Measurement of oxide thickness on inner surface of irradiated pressure tubes of RAPS-I using image analysis technique [microform] / Sunil Kumar ... [et. al.].".
- 2004327075 type "text".