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- 2004441049 contributor B10026587.
- 2004441049 created "2003.".
- 2004441049 date "2003".
- 2004441049 date "2003.".
- 2004441049 dateCopyrighted "2003.".
- 2004441049 description "Includes bibliographical references (p. 65-79).".
- 2004441049 extent "vi, 79 p. :".
- 2004441049 identifier "3896498983".
- 2004441049 identifier 2004441049.html.
- 2004441049 isPartOf "Series in microelectronics, 0936-5362 ; v. 140".
- 2004441049 issued "2003".
- 2004441049 issued "2003.".
- 2004441049 language "eng ger".
- 2004441049 language "eng".
- 2004441049 publisher "Konstanz : Hartung-Gorre,".
- 2004441049 subject "621.3815/284015118 22".
- 2004441049 subject "Metal oxide semiconductor field-effect transistors Simulation methods.".
- 2004441049 subject "Monte Carlo method.".
- 2004441049 subject "TK7871.95 .B84 2003".
- 2004441049 title "Full-band Monte Carlo simulation of nanoscale strained silicon MOSFETs / Fabian M. Bufler.".
- 2004441049 type "text".