Matches in Library of Congress for { <http://lccn.loc.gov/2005048514> ?p ?o. }
Showing items 1 to 22 of
22
with 100 items per page.
- 2005048514 contributor B10159418.
- 2005048514 created "c2006.".
- 2005048514 date "2006".
- 2005048514 date "c2006.".
- 2005048514 dateCopyrighted "c2006.".
- 2005048514 description "Includes bibliographical references and index.".
- 2005048514 extent "xv, 779 p. :".
- 2005048514 identifier "0471739065 (acid-free paper)".
- 2005048514 identifier "9780471739067".
- 2005048514 identifier 2005048514-d.html.
- 2005048514 identifier 2005048514-t.html.
- 2005048514 identifier 2005048514-b.html.
- 2005048514 issued "2006".
- 2005048514 issued "c2006.".
- 2005048514 language "eng".
- 2005048514 publisher "[Piscataway, NJ] : IEEE Press ; Hoboken, N.J. : Wiley,".
- 2005048514 subject "621.3815/2 22".
- 2005048514 subject "QC611 .S335 2006".
- 2005048514 subject "Semiconductors Testing.".
- 2005048514 subject "Semiconductors.".
- 2005048514 title "Semiconductor material and device characterization / Dieter K. Schroder.".
- 2005048514 type "text".