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- 2005050147 contributor B10161379.
- 2005050147 created "2005.".
- 2005050147 date "2005".
- 2005050147 date "2005.".
- 2005050147 dateCopyrighted "2005.".
- 2005050147 description "Includes bibliographical references and index.".
- 2005050147 extent "270 p. :".
- 2005050147 identifier "0387249931 (alk. paper)".
- 2005050147 identifier "0387263519 (e-book)".
- 2005050147 identifier "9780387249933".
- 2005050147 identifier "9780387263519".
- 2005050147 identifier 2005050147-d.html.
- 2005050147 identifier 2005050147-t.html.
- 2005050147 isPartOf "Frontiers in electronic testing".
- 2005050147 issued "2005".
- 2005050147 issued "2005.".
- 2005050147 language "eng".
- 2005050147 publisher "New York : Springer,".
- 2005050147 subject "621.3815/48 22".
- 2005050147 subject "Data mining.".
- 2005050147 subject "Integrated circuits Testing Statistical methods.".
- 2005050147 subject "Semiconductors Failures.".
- 2005050147 subject "TK7874 .H85 2005".
- 2005050147 title "Data mining and diagnosing IC fails / Leendert M. Huisman.".
- 2005050147 type "text".