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- 2005058119 contributor B10169777.
- 2005058119 contributor B10169778.
- 2005058119 created "c2006.".
- 2005058119 date "2006".
- 2005058119 date "c2006.".
- 2005058119 dateCopyrighted "c2006.".
- 2005058119 description "Includes bibliographical references and index.".
- 2005058119 extent "xvi, 498 p. :".
- 2005058119 identifier "0471414522".
- 2005058119 identifier "9780471414520 (hbk.)".
- 2005058119 identifier 2005058119-d.html.
- 2005058119 identifier 2005058119-b.html.
- 2005058119 identifier 2005058119-t.html.
- 2005058119 issued "2006".
- 2005058119 issued "c2006.".
- 2005058119 language "eng".
- 2005058119 publisher "Hoboken, N.J. : John Wiley & Sons : IEEE Press,".
- 2005058119 subject "670.42 22".
- 2005058119 subject "Clean rooms.".
- 2005058119 subject "Contamination (Technology)".
- 2005058119 subject "Electric discharges.".
- 2005058119 subject "Electronic apparatus and appliances Protection.".
- 2005058119 subject "Electrostatics.".
- 2005058119 subject "TK7870 .W36 2006".
- 2005058119 title "Contamination and ESD control in high-technology manufacturing / Roger W. Welker, R. Nagarajan, Carl E. Newberg.".
- 2005058119 type "text".