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- 2005277728 contributor B10179704.
- 2005277728 contributor B10179705.
- 2005277728 created "2005.".
- 2005277728 date "2005".
- 2005277728 date "2005.".
- 2005277728 dateCopyrighted "2005.".
- 2005277728 description "Includes bibliographical references (p. [193]-203).".
- 2005277728 extent "x, 206 p. :".
- 2005277728 identifier "0387243135 (e-book)".
- 2005277728 identifier "0387243143 (hd.bd.)".
- 2005277728 identifier 2005277728-d.html.
- 2005277728 identifier 2005277728-t.html.
- 2005277728 isPartOf "The Kluwer international series in engineering and computer science, 0893-3405 ; 851".
- 2005277728 issued "2005".
- 2005277728 issued "2005.".
- 2005277728 language "eng".
- 2005277728 publisher "New York : Springer,".
- 2005277728 subject "621.3815/284 22".
- 2005277728 subject "Metal oxide semiconductor field-effect transistors.".
- 2005277728 subject "TK7871.95 .C76 2005".
- 2005277728 title "Matching properties of deep sub-micron MOS transistors / by Jeroen A. Croon, Willy Sansen and Herman E. Maes.".
- 2005277728 type "text".