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- 2005278300 alternative "At head of title: Proceedings of electronic imaging science and technology".
- 2005278300 alternative "Electronic imaging science and technology".
- 2005278300 contributor B10180491.
- 2005278300 contributor B10180492.
- 2005278300 created "c2004.".
- 2005278300 date "2004".
- 2005278300 date "c2004.".
- 2005278300 dateCopyrighted "c2004.".
- 2005278300 description "Includes bibliographical references and index.".
- 2005278300 extent "vi, 204 p. :".
- 2005278300 identifier "0819452068 (pbk.)".
- 2005278300 isPartOf "Electronic Imaging Science and Technology Symposium. Proceedings of Electronic Imaging Science and Technology.".
- 2005278300 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 5303.".
- 2005278300 isPartOf "Proceedings, Electronic Imaging Science and Technology".
- 2005278300 isPartOf "SPIE, 0277-786X ; v. 5303".
- 2005278300 issued "2004".
- 2005278300 issued "c2004.".
- 2005278300 language "eng".
- 2005278300 publisher "Bellingham, Wash., USA : SPIE,".
- 2005278300 subject "Computer vision Industrial applications Congresses.".
- 2005278300 subject "Engineering inspection Automation Congresses.".
- 2005278300 subject "Measurement Congresses.".
- 2005278300 subject "Quality control Optical methods Automation Congresses.".
- 2005278300 subject "TS156.2 .M32582 2004".
- 2005278300 title "At head of title: Proceedings of electronic imaging science and technology".
- 2005278300 title "Electronic imaging science and technology".
- 2005278300 title "Machine vision applications in industrial inspection XII : 21-22 January, 2004, San Jose, California, USA / Jeffery R. Price, Fabrice Mériaudeau, chairs/editors ; sponsored ... by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering.".
- 2005278300 type "text".