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- 2005279852 contributor B10182381.
- 2005279852 contributor B10182382.
- 2005279852 created "c2005.".
- 2005279852 date "2005".
- 2005279852 date "c2005.".
- 2005279852 dateCopyrighted "c2005.".
- 2005279852 description "Includes bibliographical references and author index.".
- 2005279852 extent "viii, 302 p. :".
- 2005279852 identifier "0819456527 (pbk.)".
- 2005279852 isPartOf "Electronic Imaging Science and Technology Symposium. Proceedings of Electronic Imaging Science and Technology.".
- 2005279852 isPartOf "Proceedings of Electronic Imaging Science and Technology.".
- 2005279852 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 5679.".
- 2005279852 isPartOf "SPIE, 0277-786X ; vol. 5679".
- 2005279852 issued "2005".
- 2005279852 issued "c2005.".
- 2005279852 language "eng".
- 2005279852 publisher "Bellingham, Wash. : SPIE ; Springfield, Va. : IS&T,".
- 2005279852 subject "670.42/5 22".
- 2005279852 subject "Computer vision Industrial applications Congresses.".
- 2005279852 subject "Engineering inspection Automation Congresses.".
- 2005279852 subject "Measurement Congresses.".
- 2005279852 subject "Quality control Automation Congresses.".
- 2005279852 subject "TS156.2 .M32583 2005".
- 2005279852 title "Machine vision applications in industrial inspection XIII : 17-18 January 2005, San Jose, California, USA / Jeffery R. Price, Fabrice Meriaudeau, chairs/editors ; sponsored and published by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.".
- 2005279852 type "text".