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- 2005283760 alternative "11th IEEE International On-Line Testing Symposium".
- 2005283760 alternative "On-Line Testing Symposium".
- 2005283760 contributor B10187192.
- 2005283760 contributor B10187193.
- 2005283760 created "c2005.".
- 2005283760 date "2005".
- 2005283760 date "c2005.".
- 2005283760 dateCopyrighted "c2005.".
- 2005283760 description "Includes bibliographical references and author index.".
- 2005283760 extent "xv, 326 p. :".
- 2005283760 hasFormat "Also issued online with additional title: On-Line Testing Symposium, 2005, IOLTS 2005, 11th IEEE International.".
- 2005283760 identifier "0769524060".
- 2005283760 identifier opac?punumber=10031.
- 2005283760 identifier 2005283760.html.
- 2005283760 isFormatOf "Also issued online with additional title: On-Line Testing Symposium, 2005, IOLTS 2005, 11th IEEE International.".
- 2005283760 issued "2005".
- 2005283760 issued "c2005.".
- 2005283760 language "eng".
- 2005283760 publisher "Los Alamitos, Calif. : IEEE Computer Society,".
- 2005283760 relation "Also issued online with additional title: On-Line Testing Symposium, 2005, IOLTS 2005, 11th IEEE International.".
- 2005283760 subject "Electronic circuit design Congresses.".
- 2005283760 subject "Electronic circuits Testing Congresses.".
- 2005283760 subject "Error-correcting codes (Information theory) Congresses.".
- 2005283760 subject "Online data processing Congresses.".
- 2005283760 subject "TK7867 .I3715 2005".
- 2005283760 title "11th IEEE International On-Line Testing Symposium".
- 2005283760 title "IOLTS 2005 : 11th IEEE International On-Line Testing Symposium, Saint Raphael, French Riviera, France, 6-8 July 2005 / sponsored by IEEE Computer Society, Test Technology Technical Council.".
- 2005283760 title "On-Line Testing Symposium".
- 2005283760 type "text".