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- 2005284407 contributor B10187887.
- 2005284407 contributor B10187888.
- 2005284407 created "c2005.".
- 2005284407 date "2005".
- 2005284407 date "c2005.".
- 2005284407 dateCopyrighted "c2005.".
- 2005284407 description "Includes bibliographical references and author index.".
- 2005284407 extent "1 v. (various pagings) :".
- 2005284407 identifier "081945883X (pbk.)".
- 2005284407 identifier 2005284407.html.
- 2005284407 isPartOf "Proceedings of SPIE proceedings series, 0277-786X ; v. 5878".
- 2005284407 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 5878.".
- 2005284407 issued "2005".
- 2005284407 issued "c2005.".
- 2005284407 language "eng".
- 2005284407 publisher "Bellingham, Wash. : SPIE,".
- 2005284407 subject "621.381/045 22".
- 2005284407 subject "Nanotechnology Congresses.".
- 2005284407 subject "Optical measurements Congresses.".
- 2005284407 subject "Optoelectronic devices Congresses.".
- 2005284407 subject "Optoelectronics Congresses.".
- 2005284407 subject "Semiconductors Characterization Congresses.".
- 2005284407 subject "TA1750 .A332 2005".
- 2005284407 subject "Thin films Optical properties Congresses.".
- 2005284407 title "Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA / Angela Duparré, Bhanwar Singh, Zu-Han GU, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.".
- 2005284407 type "text".