Matches in Library of Congress for { <http://lccn.loc.gov/2005295655> ?p ?o. }
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- 2005295655 alternative "Memory technology, design and testing".
- 2005295655 alternative "Records of the 2004 IEEE International Workshop on Memory Technology, Design and Testing".
- 2005295655 contributor B10189235.
- 2005295655 contributor B10189236.
- 2005295655 contributor B10189237.
- 2005295655 created "c2004.".
- 2005295655 date "2004".
- 2005295655 date "c2004.".
- 2005295655 dateCopyrighted "c2004.".
- 2005295655 description "Includes bibliographical references and author index.".
- 2005295655 extent "vii, 121 p. :".
- 2005295655 identifier "0769521932".
- 2005295655 identifier opac?punumber=9251.
- 2005295655 issued "2004".
- 2005295655 issued "c2004.".
- 2005295655 language "eng".
- 2005295655 publisher "Los Alamitos, Calif. : IEEE Computer Society,".
- 2005295655 subject "621.39/732 22".
- 2005295655 subject "Random access memory Congresses.".
- 2005295655 subject "Semiconductor storage devices Testing Congresses.".
- 2005295655 subject "TK7895.M4 I334 2004".
- 2005295655 title "MTDT 2004 : records of the 2004 International Workshop on Memory Technology, Design and Testing : 9-10 August, 2004, San Jose, California, USA / edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.".
- 2005295655 title "Memory technology, design and testing".
- 2005295655 title "Records of the 2004 IEEE International Workshop on Memory Technology, Design and Testing".
- 2005295655 type "text".