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- 2005296024 contributor B10189711.
- 2005296024 contributor B10189712.
- 2005296024 created "c2005.".
- 2005296024 date "2005".
- 2005296024 date "c2005.".
- 2005296024 dateCopyrighted "c2005.".
- 2005296024 description "Includes bibliographical references and author index.".
- 2005296024 extent "xiv, 514 p. :".
- 2005296024 identifier "0819455903".
- 2005296024 isPartOf "Proceedings of SPIE, 0277-786X ; v. 5635".
- 2005296024 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 5635.".
- 2005296024 issued "2005".
- 2005296024 issued "c2005.".
- 2005296024 language "eng".
- 2005296024 publisher "Bellingham, Wash. : SPIE,".
- 2005296024 subject "620/.5 22".
- 2005296024 subject "Metrology Congresses.".
- 2005296024 subject "Nanophotonics Congresses.".
- 2005296024 subject "Nanostructured materials Optical properties Congresses.".
- 2005296024 subject "Nanotechnology Congresses.".
- 2005296024 subject "TA418.9.N35 N3434 2005".
- 2005296024 title "Nanophotonics, nanostructure, and nanometrology : 8-10 November 2004, Beijing, China / Xing Zhu, Stephen Y. Chou, Yasuhiko Arakawa, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, COS--Chinese Optical Society ; cooperating organizations, Australian Optical Society ... [et al.] ; supporting organizations, National Natural Science Foundation of China ... [et al.].".
- 2005296024 type "text".