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- 2005298511 contributor B10192511.
- 2005298511 contributor B10192512.
- 2005298511 contributor B10192513.
- 2005298511 created "c2004.".
- 2005298511 date "2004".
- 2005298511 date "c2004.".
- 2005298511 dateCopyrighted "c2004.".
- 2005298511 description "Includes bibliographical references and author index.".
- 2005298511 extent "x, 172 p. :".
- 2005298511 identifier "0819454761 (pbk.)".
- 2005298511 isPartOf "Proceedings of SPIE, 0277-786X ; v. 5538".
- 2005298511 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 5538.".
- 2005298511 issued "2004".
- 2005298511 issued "c2004.".
- 2005298511 language "eng".
- 2005298511 publisher "Bellingham, Wash. : SPIE,".
- 2005298511 subject "530.4/175 22".
- 2005298511 subject "Optical constants Congresses.".
- 2005298511 subject "QC176.84.O7 O654 2004".
- 2005298511 subject "Refractive index Measurement Technique Congresses.".
- 2005298511 subject "Thin films Optical properties Congresses.".
- 2005298511 title "Optical constants of materials for UV to X-ray wavelengths : 4-5 August, 2004, Denver, Colorado, USA / Regina Soufli, John F. Seely, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.".
- 2005298511 type "text".