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- 2005374763 alternative "Noise and degradation processes in semiconductor devices, metrology, diagnostic, technology, cirriculum [i.e., curriculum]".
- 2005374763 contributor B10249294.
- 2005374763 created "2004.".
- 2005374763 date "2004".
- 2005374763 date "2004.".
- 2005374763 dateCopyrighted "2004.".
- 2005374763 description "Includes bibliographical references.".
- 2005374763 extent "335 p. :".
- 2005374763 issued "2004".
- 2005374763 issued "2004.".
- 2005374763 language "Articles in Russian, with abstracts in English.".
- 2005374763 language "rus eng".
- 2005374763 language "rus".
- 2005374763 publisher "Moskva : Moskovskiĭ ėnerg. in-t (tekhn. universitet),".
- 2005374763 subject "Electronic noise Mathematical models Congresses.".
- 2005374763 subject "Semiconductors Failures Congresses.".
- 2005374763 subject "Semiconductors Reliability Congresses.".
- 2005374763 subject "TK7871.85 .S528 2004".
- 2005374763 title "Noise and degradation processes in semiconductor devices, metrology, diagnostic, technology, cirriculum [i.e., curriculum]".
- 2005374763 title "Shumovye i degradat︠s︡ionnye prot︠s︡essy v poluprovodnikovykh priborakh : metrologii︠a︡, diagnostika, tekhnologii︠a︡, uchebnyĭ prot︠s︡ess : materialy dokladov Mezhdunarodnogo nauchno-metodicheskogo seminara, Moskva, 1-5 dekabri︠a︡ 2003 g. = Noise and degradation processes in semiconductor devices : metrology, diagnostic, technology, cirriculum [i.e., curriculum] / predislovie A.M. Guli︠a︡eva.".
- 2005374763 type "text".