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- 2005920974 alternative "2005 IIRW final report".
- 2005920974 alternative "IIRW 2005".
- 2005920974 alternative "Integrated reliability workshop".
- 2005920974 contributor B10390717.
- 2005920974 contributor B10390718.
- 2005920974 created "c2005.".
- 2005920974 date "2005".
- 2005920974 date "c2005.".
- 2005920974 dateCopyrighted "c2005.".
- 2005920974 description "Includes bibliographical references.".
- 2005920974 extent "vi, 182 p. :".
- 2005920974 hasFormat "Also issued online.".
- 2005920974 identifier "0780389921".
- 2005920974 identifier opac?punumber=10702.
- 2005920974 isFormatOf "Also issued online.".
- 2005920974 issued "2005".
- 2005920974 issued "c2005.".
- 2005920974 language "eng".
- 2005920974 publisher "Piscataway, N.J. : IEEE Electron Devices Society ; IEEE Reliability Society,".
- 2005920974 relation "Also issued online.".
- 2005920974 subject "Integrated circuits Reliability Congresses.".
- 2005920974 subject "Integrated circuits Wafer-scale integration Reliability Congresses.".
- 2005920974 subject "MLCM 2006/40231 (T)".
- 2005920974 title "2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society".
- 2005920974 title "2005 IIRW final report".
- 2005920974 title "IIRW 2005".
- 2005920974 title "Integrated reliability workshop".
- 2005920974 type "text".