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- 2005931757 contributor B10399420.
- 2005931757 created "c2006.".
- 2005931757 date "2006".
- 2005931757 date "c2006.".
- 2005931757 dateCopyrighted "c2006.".
- 2005931757 description "Includes bibliographical references (p. [195]-202) and index.".
- 2005931757 extent "ix, 224 p. :".
- 2005931757 identifier "3540279857 (hbk.)".
- 2005931757 identifier "9783540279860".
- 2005931757 identifier 2005931757-d.html.
- 2005931757 identifier 2005931757-b.html.
- 2005931757 identifier 2005931757.html.
- 2005931757 issued "2006".
- 2005931757 issued "c2006.".
- 2005931757 language "eng".
- 2005931757 publisher "Berlin ; New York : Springer,".
- 2005931757 subject "548/.83 22".
- 2005931757 subject "QD945 .W45 2006".
- 2005931757 subject "Rietveld method.".
- 2005931757 subject "X-rays Diffraction.".
- 2005931757 title "Powder diffraction : the Rietveld method and the two-stage method to determine and refine crystal structures from powder diffraction data / Georg Will.".
- 2005931757 type "text".