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- 2005933265 contributor B10400638.
- 2005933265 contributor B10400639.
- 2005933265 created "c2007.".
- 2005933265 date "2007".
- 2005933265 date "c2007.".
- 2005933265 dateCopyrighted "c2007.".
- 2005933265 description "Includes bibliographical references and index.".
- 2005933265 extent "xiv, 336 p. :".
- 2005933265 identifier "0387292608 (hbk.)".
- 2005933265 identifier "0387292616 (e-book)".
- 2005933265 identifier "9780387292601 (hbk.)".
- 2005933265 identifier "9780387292618 (e-book)".
- 2005933265 identifier 2005933265-d.html.
- 2005933265 identifier 2005933265.html.
- 2005933265 issued "2007".
- 2005933265 issued "c2007.".
- 2005933265 language "eng".
- 2005933265 publisher "New York, N.Y. ; London : Springer,".
- 2005933265 subject "621.3815/2 22".
- 2005933265 subject "Nanostructured materials.".
- 2005933265 subject "QC176.83 .A44 2006".
- 2005933265 subject "Thin films.".
- 2005933265 title "Fundamentals of nanoscale film analysis / Terry L. Alford, Leonard C. Feldman and James W. Mayer.".
- 2005933265 type "text".