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- 2005936713 contributor B10403254.
- 2005936713 contributor B10403255.
- 2005936713 created "c2006.".
- 2005936713 date "2006".
- 2005936713 date "c2006.".
- 2005936713 dateCopyrighted "c2006.".
- 2005936713 description "Includes bibliographical references and index.".
- 2005936713 extent "xiv, 281 p. :".
- 2005936713 identifier "0387400907".
- 2005936713 identifier "9780387400907".
- 2005936713 identifier 2005936713-d.html.
- 2005936713 identifier 2005936713-t.html.
- 2005936713 isPartOf "Nanoscience and technology".
- 2005936713 issued "2006".
- 2005936713 issued "c2006.".
- 2005936713 language "eng".
- 2005936713 publisher "New York : Springer Science+Business,".
- 2005936713 subject "502.8/2 22".
- 2005936713 subject "QH212.S33 F68 2006".
- 2005936713 subject "Scanning probe microscopy.".
- 2005936713 title "Scanning probe microscopy : atomic scale engineering by forces and currents / A. Foster, W. Hofer.".
- 2005936713 type "text".