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- 2006006869 contributor B10413549.
- 2006006869 created "c2006.".
- 2006006869 date "2006".
- 2006006869 date "c2006.".
- 2006006869 dateCopyrighted "c2006.".
- 2006006869 description "Includes bibliographical references and index.".
- 2006006869 extent "xxx, 777 p. :".
- 2006006869 identifier "0123705975 (hardcover : alk. paper)".
- 2006006869 identifier "9780123705976".
- 2006006869 identifier 2006006869-d.html.
- 2006006869 identifier 2006006869.html.
- 2006006869 isPartOf "The Morgan Kaufmann series in systems on silicon".
- 2006006869 issued "2006".
- 2006006869 issued "c2006.".
- 2006006869 language "eng".
- 2006006869 publisher "Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers,".
- 2006006869 subject "621.39/5 22".
- 2006006869 subject "Integrated circuits Very large scale integration Design.".
- 2006006869 subject "Integrated circuits Very large scale integration Testing.".
- 2006006869 subject "TK7874.75 .V587 2006".
- 2006006869 title "VLSI test principles and architectures : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.".
- 2006006869 type "text".