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- 2006030741 contributor B10442554.
- 2006030741 created "c2007.".
- 2006030741 date "2007".
- 2006030741 date "c2007.".
- 2006030741 dateCopyrighted "c2007.".
- 2006030741 description "Includes bibliographical references and index.".
- 2006030741 extent "xviii, 369 p. :".
- 2006030741 identifier "0470016086 (cloth : alk. paper)".
- 2006030741 identifier "9780470016084 (cloth : alk. paper)".
- 2006030741 identifier 2006030741-b.html.
- 2006030741 identifier 2006030741-d.html.
- 2006030741 identifier 2006030741.html.
- 2006030741 issued "2007".
- 2006030741 issued "c2007.".
- 2006030741 language "eng".
- 2006030741 publisher "Chichester, England ; Hoboken, NJ : John Wiley & Sons,".
- 2006030741 subject "620.1/1295 22".
- 2006030741 subject "Ellipsometry.".
- 2006030741 subject "Materials Optical properties.".
- 2006030741 subject "QC443 .F85 2007".
- 2006030741 subject "Spectrum analysis.".
- 2006030741 title "Spectroscopic ellipsometry : principles and applications / Hiroyuki Fujiwara.".
- 2006030741 type "text".