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- 2006271190 contributor B10472606.
- 2006271190 contributor B10472607.
- 2006271190 created "c2005.".
- 2006271190 date "2005".
- 2006271190 date "c2005.".
- 2006271190 dateCopyrighted "c2005.".
- 2006271190 description "Includes bibliographical references and author index.".
- 2006271190 extent "x, 168 p. :".
- 2006271190 identifier "0819457477 (pbk.)".
- 2006271190 isPartOf "Proceedings of SPIE, 0277-786X ; v. 5766".
- 2006271190 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 5766.".
- 2006271190 issued "2005".
- 2006271190 issued "c2005.".
- 2006271190 language "eng".
- 2006271190 publisher "Bellingham, Wash. : SPIE,".
- 2006271190 subject "621.36 22".
- 2006271190 subject "Electrooptical devices Materials Testing Congresses.".
- 2006271190 subject "Microelectromechanical systems Testing Congresses.".
- 2006271190 subject "Nanostructured materials Testing Congresses.".
- 2006271190 subject "Photonics Materials Testing Congresses.".
- 2006271190 subject "TA1750 .T473 2005".
- 2006271190 title "Testing, reliability, and application of micro- and nano-material systems III : 8-10 March 2005, San Diego, California, USA / Robert E. Geer ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.".
- 2006271190 type "text".