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- 2006273391 contributor B10475311.
- 2006273391 created "2005.".
- 2006273391 date "2005".
- 2006273391 date "2005.".
- 2006273391 dateCopyrighted "2005.".
- 2006273391 description "Includes bibliographical references (p. 190-193) and index.".
- 2006273391 extent "xiv, 198 p. :".
- 2006273391 identifier "052101753X (pbk.)".
- 2006273391 identifier "9780521017534 (pbk.)".
- 2006273391 identifier 2006273391-d.html.
- 2006273391 identifier 2006273391-t.html.
- 2006273391 isPartOf "Cambridge solid state science series".
- 2006273391 issued "2005".
- 2006273391 issued "2005.".
- 2006273391 language "eng".
- 2006273391 publisher "Cambridge ; New York : Cambridge University Press,".
- 2006273391 subject "Polymers Surfaces Analysis.".
- 2006273391 subject "QD381.9.S97 B75 2005".
- 2006273391 subject "Secondary ion mass spectrometry.".
- 2006273391 subject "X-ray spectroscopy.".
- 2006273391 title "Surface analysis of polymers by XPS and static SIMS / D. Briggs.".
- 2006273391 type "text".