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- 2006273468 contributor B10475408.
- 2006273468 contributor B10475409.
- 2006273468 created "c2005.".
- 2006273468 date "2005".
- 2006273468 date "c2005.".
- 2006273468 dateCopyrighted "c2005.".
- 2006273468 description "Includes bibliographical references and indexes.".
- 2006273468 extent "xiii, 208 p. :".
- 2006273468 identifier "9812563954".
- 2006273468 isPartOf "Selected topics in electronics and systems ; v. 36".
- 2006273468 issued "2005".
- 2006273468 issued "c2005.".
- 2006273468 language "eng".
- 2006273468 publisher "New Jersey ; London : World Scientific,".
- 2006273468 subject "621.38152 22".
- 2006273468 subject "Breakdown (Electricity)".
- 2006273468 subject "High voltages.".
- 2006273468 subject "Semiconductors.".
- 2006273468 subject "TK7871.85 .L463 2005".
- 2006273468 title "Breakdown phenomena in semiconductors and semiconductor devices / Michael Levinshtein, Juha Kostamovaara, Sergey Vainshtein.".
- 2006273468 type "text".