Matches in Library of Congress for { <http://lccn.loc.gov/2006274577> ?p ?o. }
Showing items 1 to 23 of
23
with 100 items per page.
- 2006274577 contributor B10476857.
- 2006274577 contributor B10476858.
- 2006274577 created "c2005.".
- 2006274577 date "2005".
- 2006274577 date "c2005.".
- 2006274577 dateCopyrighted "c2005.".
- 2006274577 description "Includes bibliographical references and author index.".
- 2006274577 extent "1 v. (various pagings) :".
- 2006274577 identifier "0819459836 (pbk.)".
- 2006274577 isPartOf "Proceedings of SPIE, 0277-786X ; v. 5965".
- 2006274577 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 5965.".
- 2006274577 issued "2005".
- 2006274577 issued "c2005.".
- 2006274577 language "eng".
- 2006274577 publisher "Bellingham, Wash., USA : SPIE,".
- 2006274577 subject "681/.4 22".
- 2006274577 subject "Metrology Congresses.".
- 2006274577 subject "Optical instruments Design and construction Congresses.".
- 2006274577 subject "Optical instruments Testing Congresses.".
- 2006274577 subject "Optical materials Congresses.".
- 2006274577 subject "QC372.2.D4 O68 2005".
- 2006274577 title "Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany / Angela Duparré, Roland Geyl, Lingli Wang, chairs/editors ; sponsored by SPIE Europe ; cosponsored by Friedrich-Schiller-Universität Jena (Germany) ; cooperating organizations, EOS--European Optical Society, DGaO--Deutsche Gesellschaft für Angewandte Optik e.V. (Germany), Optonet e.V. (Germany).".
- 2006274577 type "text".