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- 2006274784 contributor B10477127.
- 2006274784 created "c2005.".
- 2006274784 date "2005".
- 2006274784 date "c2005.".
- 2006274784 dateCopyrighted "c2005.".
- 2006274784 description "Includes bibliographical references (p. [353]-382) and index.".
- 2006274784 extent "xv, 388 p. :".
- 2006274784 identifier "0387256245 (e-book)".
- 2006274784 identifier "1402032072 (hbk. : acid free paper)".
- 2006274784 identifier "9780387256245 (e-book)".
- 2006274784 identifier "9781402032073".
- 2006274784 identifier 2006274784-d.html.
- 2006274784 identifier 2006274784-b.html.
- 2006274784 identifier 2006274784-t.html.
- 2006274784 isPartOf "Frontiers in electronic testing ; 29".
- 2006274784 issued "2005".
- 2006274784 issued "c2005.".
- 2006274784 language "eng".
- 2006274784 publisher "Dordrecht : Springer,".
- 2006274784 subject "621.3815 22".
- 2006274784 subject "Integrated circuits Design and construction.".
- 2006274784 subject "Systems on a chip Testing.".
- 2006274784 subject "TK7895.E42 L37 2005".
- 2006274784 title "Introduction to advanced system-on-chip test design and optimization / by Erik Larsson.".
- 2006274784 type "text".