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- 2006275156 contributor B10477610.
- 2006275156 contributor B10477611.
- 2006275156 created "c2005.".
- 2006275156 date "2005".
- 2006275156 date "c2005.".
- 2006275156 dateCopyrighted "c2005.".
- 2006275156 description "Includes bibliographical references and index.".
- 2006275156 extent "ix, 182 p. :".
- 2006275156 identifier "038725742X (hd.bd.)".
- 2006275156 identifier "9780387257426 (hd.bd.)".
- 2006275156 identifier 2006275156-d.html.
- 2006275156 identifier 2006275156-t.html.
- 2006275156 isPartOf "FRET 30".
- 2006275156 isPartOf "Frontiers in electronic testing v. 30".
- 2006275156 issued "2005".
- 2006275156 issued "c2005.".
- 2006275156 language "eng".
- 2006275156 publisher "Dordrecht : Springer,".
- 2006275156 subject "621.3815 22".
- 2006275156 subject "Linear integrated circuits Testing.".
- 2006275156 subject "Linear integrated circuits.".
- 2006275156 subject "TK7874.654 .K335 2005".
- 2006275156 title "Fault diagnosis of analog integrated circuits / by Prithviraj Kabisatpathy, Alok Barua and Satyabroto Sinha.".
- 2006275156 type "text".