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- 2006276029 alternative "Two- and three-dimensional vision systems for inspection, control, and metrology.".
- 2006276029 contributor B10478682.
- 2006276029 contributor B10478683.
- 2006276029 created "c2005.".
- 2006276029 date "2005".
- 2006276029 date "c2005.".
- 2006276029 dateCopyrighted "c2005.".
- 2006276029 description "Includes bibliographical references and author index.".
- 2006276029 extent "1 v. (various pagings) :".
- 2006276029 identifier "0819460249 (pbk.)".
- 2006276029 isPartOf "Proceedings of SPIE, 0277-786X ; v. 6000".
- 2006276029 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 6000.".
- 2006276029 issued "2005".
- 2006276029 issued "c2005.".
- 2006276029 language "eng".
- 2006276029 publisher "Bellingham, Wash. : SPIE,".
- 2006276029 subject "681/.25 22".
- 2006276029 subject "Computer vision Congresses.".
- 2006276029 subject "Imaging systems Congresses.".
- 2006276029 subject "Metrology Congresses.".
- 2006276029 subject "Optical measurements Congresses.".
- 2006276029 subject "Quality control Optical methods Congresses.".
- 2006276029 subject "TA1634 .T89 2005".
- 2006276029 subject "Three-dimensional display systems Congresses.".
- 2006276029 title "Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA / Kevin G. Harding, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.".
- 2006276029 type "text".