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- 2006276632 alternative "GADEST 2005".
- 2006276632 alternative "Gettering and defect engineering in semiconductor technology 9".
- 2006276632 contributor B10479420.
- 2006276632 contributor B10479421.
- 2006276632 created "2005.".
- 2006276632 date "2005".
- 2006276632 date "2005.".
- 2006276632 dateCopyrighted "2005.".
- 2006276632 description "Includes bibliographical references and index.".
- 2006276632 extent "xvi, 814 p. :".
- 2006276632 identifier "3908451132 (pbk.)".
- 2006276632 isPartOf "Solid state phenomena ; vols. 108-109".
- 2006276632 issued "2005".
- 2006276632 issued "2005.".
- 2006276632 language "eng".
- 2006276632 publisher "Uetikon-Zuerich : TTP,".
- 2006276632 subject "621.3815/2 22".
- 2006276632 subject "Getters Congresses.".
- 2006276632 subject "Semiconductors Defects Congresses.".
- 2006276632 subject "Semiconductors Materials Congresses.".
- 2006276632 subject "Silicon crystals Congresses.".
- 2006276632 subject "TK7871.85 .I574 2005".
- 2006276632 title "GADEST 2005".
- 2006276632 title "Gettering and defect engineering in semiconductor technology 9".
- 2006276632 title "Gettering and defect engineering in semiconductor technology XI : GADEST 2005 : proceedings of the 11th International Autumn Meeting : Giens, France, September 25-30, 2005 / edited by B. Pichaud ... [et al.].".
- 2006276632 type "text".