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- 2006281048 contributor B10484953.
- 2006281048 contributor B10484954.
- 2006281048 created "c2005.".
- 2006281048 date "2005".
- 2006281048 date "c2005.".
- 2006281048 dateCopyrighted "c2005.".
- 2006281048 description "Includes bibliographical references and author index.".
- 2006281048 extent "1 v. (various pagings) :".
- 2006281048 identifier "0819458856".
- 2006281048 identifier 2006281048.html.
- 2006281048 isPartOf "Proceedings of SPIE ; v. 5880".
- 2006281048 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 5880.".
- 2006281048 issued "2005".
- 2006281048 issued "c2005.".
- 2006281048 language "eng".
- 2006281048 publisher "Bellingham, Wash. : SPIE,".
- 2006281048 subject "Materials Testing Congresses.".
- 2006281048 subject "Optical measurements Congresses.".
- 2006281048 subject "Reflectance Congresses.".
- 2006281048 subject "Refractive index Congresses.".
- 2006281048 subject "TA418.7 .O7 2005".
- 2006281048 title "Optical diagnostics : 3-4 August, 2005, San Diego, California, USA / Leonard M. Hanssen, Patrick V. Farrell, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.".
- 2006281048 type "text".