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- 2006282472 contributor B10486862.
- 2006282472 contributor B10486863.
- 2006282472 created "c2006.".
- 2006282472 date "2006".
- 2006282472 date "c2006.".
- 2006282472 dateCopyrighted "c2006.".
- 2006282472 description "Includes bibliographical references and author index.".
- 2006282472 extent "1 v. (various pagings) :".
- 2006282472 identifier "0819462284 (pbk.)".
- 2006282472 identifier 2006282472.html.
- 2006282472 isPartOf "Proceedings of SPIE, 0277-786X ; v. 6175".
- 2006282472 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 6175.".
- 2006282472 issued "2006".
- 2006282472 issued "c2006.".
- 2006282472 language "eng".
- 2006282472 publisher "Bellingham, Wash. : SPIE,".
- 2006282472 subject "Electrooptical devices Materials Testing Congresses.".
- 2006282472 subject "Microelectromechanical systems Testing Congresses.".
- 2006282472 subject "Nanostructured materials Testing Congresses.".
- 2006282472 subject "Photonics Materials Testing Congresses.".
- 2006282472 subject "TA1750 .T474 2006".
- 2006282472 title "Testing, reliability, and application of micro- and nano-material systems IV : 28 February-2 March 2006, San Diego, California, USA / Robert E. Geer ... [et al.], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by ASME--American Society of Mechanical Engineers (USA) ; cooperating organizations, Intelligent Materials Forum (Japan), Jet Propulsion Laboratory (USA), National Science Foundation (USA).".
- 2006282472 type "text".